IEC Equipment Reliability Testing – Part 4: Statistical Procedures for Exponential Distribution – Point Estimates, Confidence Intervals, Prediction. Buy IEC EQUIPMENT RELIABILITY TESTING – PART 4: STATISTICAL PROCEDURES FOR EXPONENTIAL DISTRIBUTION – POINT ESTIMATES. Buy IEC Ed. Equipment reliability testing Part 4: Statistical procedures for exponential distribution – Point estimates, confidence intervals, prediction.
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Describes direct current dc powered mobile equipment tests as give in IEC Standardization of data-collection practices facilitates 66005 exchange of information between parties, e. Describes procedures for modeling system reliability to calculate reliability and availability measures and contains a standard set of symbols related to reliability parameters.
Equipment reliability testing – Part 2: Testability and diagnostic testing.
You can download and open this file to irc own computer but DRM prevents opening this file on another computer, including a networked server. Already Subscribed to this document. The failure modes defined in ISO Risk analysis of technological systems. Describes guidelines for the collection of data relating to reliability, maintainability, availability, and maintenance support performance in the field.
Part 1- Section One, Two and Three. The major technical changes with respect to the previous iex concern the inclusion of corrected formulae for tests previously included in a corrigendum, and the addition of new methods for the analysis of multiple items.
Maintenance and maintenance support planning. Please first verify your email before subscribing to alerts. Ministry of Commerce and Industry.
“Reliabilty and dependability standards are described.”
Methods of evaluating the performance of intelligent valve ic with pneumatic outputs which specifies design reviews and tests intended to measure the valve characteristics.
The files of this standards is not available in the store right now. Tests for the validity of the constant failure rate or constant failure intensity assumptions.
This part of IEC provides a general procedure for design of test cycles, where no applicable preferred test cycles can be found in IEC Application guide- Section 3: IEC Presentation and specification of reliability data for electronic components. You may delete a document from your Alert Profile at any time.
Characteristics and design of machines, apparatus, equipment Including reliability, dependability, maintainability, durability, etc. This website is best viewed with browser version of up to Microsoft Internet Explorer 8 or Firefox 3.
Describes data needed to characterizing reliability of components and gives guidance to users how to specify their reliability requirements to manufacturers.
Please download Chrome or Firefox or view our browser tips. Describes maintainability requirements and related design and use parameter, and discusses some activities necessary to achieve the required maintainability characteristics and their relationship to planning of maintenance.
They are an efficient method for avoiding the not invented here NIH syndrome. Add to Alert PDF. Describes a number of optimized test plans, the corresponding operating characteristic curves and expected test times.
Describes techniques covering quantitative aspects of maintainability. This may be due to a requirement or for the purpose of ied the behaviour in time of the failure rate or the failure intensity. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans.
Accept and continue Learn more about the cookies we use and how to change your settings. Application guide- Reliability centered maintenance. Describes the design of operating eand environmental test cycles referenced in section 8.
The resulting test cycle should be included in the detailed reliability test specification. Describes iwc methods for performing a Weibull goodness of fit test for two-parameter Weibull distribution using maximum likelihood methods.
Search all products by. A wide variety of subjects are available from IEC International Electrical Congress TC subcommittee for publications Technical Committee 56 is responsible for dependability issues driven by a strategic policy statement.
BS IEC 60605-4:2001
The committee was formed in as TC 56 Reliability and Maintainability and the title was changed to Dependability in and in it was agreed that the scope should no longer be limited to 60650 electrotechnical field but should address generic dependability issues across all iwc.
Also refer to following documents for data collection: It also provides guidance to users as to how they should specify their reliability requirements to manufactures. Pre-exposure tests may in some cases be necessary before commencing the test cycles designed by the methods of this standard.